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TTTC's
Electronic Broadcasting Service
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IEEE Test Technology Educational
Program 2015 http://ttep.tttc-events.org/ttep/tutorials.html
http://www.date-conference.com/conference/monday-tutorials Early registration deadline: Tuesday, February 10, 2015 |
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DATE 2015 - CALL FOR
TUTORIALS PARTICIPATION
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TThe Tutorials & Education Group (TEG) of the IEEE Computer Society Test Technology Technical Council (TTTC) organizes in 2015 a comprehensive set of Test Technology Tutorials to be held in conjunction with TTTC sponsored technical meetings. In this context, the Design, Automation and Test in
Europe 2015 (DATE’15) will include 2 excellent TTEP
half-day tutorials on high interesting and
interdisciplinary technology topic. These tutorials
qualify for IEEE TTTC certification and will be
presented on Monday, March 9th 2015. |
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Register for the Tutorials at the DATE 2015
Registration page: http://www.date-conference.com/registration
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Tutorial
M09 Testing Haralampos Stratigopoulos, TIMA Laboratory, FR Yiorgos Makris, The University of Texas at Dallas, US Throughout the design and production lifetime of an integrated circuit, a wealth of data is collected for ensuring its robust and reliable operation. Ranging from design-time simulations to process characterization monitors on first silicon, and from high-volume specification tests to diagnostic measurements on chips returned from the field, the information inherent in this data is invaluable. At the same time, the need for cost-effective solutions for various test-related tasks is becoming more pressing, especially in complex mixed-signal Systems-on-Chip. As a result, using data analytics methods to mine this information and identify meaningful correlations has seen intense interest and numerous breakthroughs have been made during the last decade. To motivate the need, the challenges, and the benefits of using data analytics, this tutorial will discuss its utility on the following actual industrial problems: (a) extraction of wafer-level spatial and lot-level spatiotemporal correlation and utilization in test cost reduction, process monitoring, and yield learning, (b) test cost reduction through replacement of costly tests by low-cost alternatives and/or elimination of superfluous tests, either statically or adaptively during test application, and (c) pre-deployment evaluation of candidate test methods through probabilistic test metrics. This tutorial is intended for (a) process and test engineers who wish to understand the utility of data analytics in their practice, (b) graduate students/faculty/researchers who wish to familiarize with the state-of-the-art and conduct research in this domain, and (c) data analytics experts who wish to apply their expertise on semiconductor manufacturing data. Further information in: http://www.date-conference.com/conference/tutorial-m09 Memory Test and Reliability in Nano-Era Tutorial M10 Testing Chair: The objective is to provide attendees with an overview
of memory test, reliability and yield improvement. Further information in: |
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| Additional Information | |
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Paolo Bernardi |
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| Committee | |
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VICE CHAIR (PROGRAM)
PAST CHAIR
FINANCE CHAIR
PUBLICITY CHAIRS
PLANNING CHAIR
INDUSTRIAL RELATIONS CHAIR
AUDIO/VISUAL CHAIRS
ELECTRONIC MEDIA CHAIRS
ORGANIZING LIASONS
PROGRAM COMMITTEE
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For more information,
visit us on the web at: http://ttep.tttc-events.org/ttep/tutorials.html
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The Test Technology Educational Program 2015 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC) |
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IEEE Computer
Society- Test Technology Technical Council
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TTTC CHAIR PAST CHAIR
TTTC 1ST VICE CHAIR SECRETARY ITC GENERAL CHAIR
TEST WEEK
COORDINATOR TUTORIALS AND
EDUCATION STANDARDS EUROPE MIDDLE EAST
& AFRICA STANDING
COMMITTEES ELECTRONIC
MEDIA |
PRESIDENT OF
BOARD SENIOR PAST
CHAIR TTTC 2ND VICE CHAIR FINANCE
IEEE DESIGN
& TEST EIC TECHNICAL
MEETINGS TECHNICAL
ACTIVITIES ASIA &
PACIFIC LATIN AMERICA
NORTH AMERICA
COMMUNICATIONS INDUSTRY
ADVISORY BOARD | |